University of Virginia
Xinfei Guo received his Ph.D. degree in Computer Engineering from the University of Virginia in May 2018. He also held a M.S. degree in Electrical and Computer Engineering from the University of Florida, Gainesville, FL, in 2012 and a B.S. degree in Microelectronics from Xidian University, Xi’an, China, in 2010. He has a broad interest in digital circuit and microarchitectures. His PhD research focused on Reliability (Wearout and Accelerated Recovery Techniques), Cross-layer power and reliability co-design methodology, Low-power and Energy-efficient digital design. He is a student member of the IEEE and ACM, and a recipient of the 2017 IEEE Circuits and Systems (CAS) Pre-Doctoral Scholarship. He also received the Best Paper Awards at SRC TECHCON 2017 and SELSE 2017, and received Louis T. Radar Graduate Research Award from ECE department and A. Richard Newton Young Student Fellowship from DAC 2013. He has published and co-authored more than 20 peer-reviewed papers and has served as an active reviewer for various IEEE/ACM conferences and journals, such as DAC, ISCAS, ICCD, ISVLSI, ICCAD, TCAS I and II, TVLSI, TCAD, D & T, etc. He is also a Featured Reviewer for ACM Computing Reviews and served as the conference committee for MicDAT’ 2018 and PRIME 2018 & 2017. More details can be found from his website http://www.xinfeiguo.com.